Material Characterization

We use X-Ray Diffraction, Scanning Electron Microscopy (SEM), Field-Emission SEM for high-resolution work, Energy Dispersive X-Ray Spectroscopy (EDS), Fourier Transform Infrared Spectroscopy (FTIR), Atomic Force Microscopy (AFM), and DSC and TGA thermal analysis to characterize advanced materials for your R&D in advanced materials.

• Single Crystal Orientation
• Thin Film Analysis
• Surface Analysis
• Surface Analysis
• Chemical and Material Analysis

Research and Development

Chemat Technology is a leading R&D company in sol-gel technologies and products with more than 25 years of experience in conducting hundreds of diversified R&D projects. Our clients include federal government agencies (e.g. DOD, DOE, NIH, NASA), private industries (including Fortune-500 companies), and new venture companies.