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Material Characterization

We use X-Ray Diffraction, Scanning Electron Microscopy (SEM), Field-Emission SEM for high-resolution work, Energy Dispersive X-Ray Spectroscopy (EDS), Fourier Transform Infrared Spectroscopy (FTIR), Atomic Force Microscopy (AFM), and DSC and TGA thermal analysis to characterize advanced materials for your R&D in advanced materials.