Material Characterization
We use X-Ray Diffraction, Scanning Electron Microscopy (SEM), Field-Emission SEM for high-resolution work, Energy Dispersive X-Ray Spectroscopy (EDS), Fourier Transform Infrared Spectroscopy (FTIR), Atomic Force Microscopy (AFM), and DSC and TGA thermal analysis to characterize advanced materials for your R&D in advanced materials.